OBIST Method for Fault Detection in CMOS Complex Digital Circuits

OBIST Method for Fault Detection in CMOS Complex Digital Circuits

The paper deals with an oscillation based built-in self-test (OBIST) technique to test faults in complex CMOS digital circuits (CCDCs). It focuses on stuck-at-faults, open or short faults, parametric gate delay faults. The method converts complex CMOS digital circuit under test (CCDCUT) to an oscillator and the output pulses are measured for fix time duration. Discrepancy in the number of pulse...

B73-12 Fault Detection in Digital Circuits

A Fault Detection Method for Combinational Circuits

As transistors become increasingly smaller and faster and noise margins become tighter, circuits and chip specially microprocessors tend to become more vulnerable to permanent and transient hardware faults. Most microprocessor designers focus on protecting memory elements among other parts of microprocessors against hardware faults through adding redundant error-correcting bits such as parity b...

Charge Sharing Fault Detection for CMOS Domino Logic Circuits

Because domino logic design offers smaller area and higher speed than conventional CMOS design, it is very popular in the high performance processor design. However, domino logic suffers from several design problems and one of the most notable design problems is the charge sharing problem. In domino logic, there are two operations: the pre-charge phase and the evaluation phase. The charge shari...

Transistor Stuck-Open Fault Detection in Multilevel CMOS Circuits

The necessary and sufficient conditions for detecting transistor stuck-open faults in arbitrary multi-level;el CMOS circuits are show. A method for representing a twopattern test for detecting a single stud-open fault using only one cube is presented. The relationship between the D-algorithm and the conditions for detecting transistor stuck-open faults in CMOS circuits is provided. The applicat...